Precision, Stability, and Efficiency | Zero Temperature Drift, Calibration-Free | Micsig Third-Generation Opto‑Isolated Probe Officially Launched!
Release time:2026-05-09
The first-generation opto‑isolated probe filled a domestic technological gap, and by the time the second generation was introduced, it had already seen widespread adoption in power‑electronics applications such as photovoltaic inverters, energy storage systems, third‑generation semiconductors, industrial power supplies, motor drives, automotive on‑board chargers, and charging stations. Leveraging its proprietary core technologies, Maxin has undertaken a comprehensive product evolution and officially launched its third‑generation opto‑isolated probe, achieving breakthroughs across measurement accuracy, user experience, and adaptability to diverse operating conditions—particularly under high‑voltage, high‑frequency, and severe electromagnetic interference environments.
Full-band, full-range coverage
The product line includes four models—MOIP200P, MOIP350P, MOIP500P, and MOIP1000P—perfectly suited to demanding test environments characterized by high frequency, high voltage, and strong radiation, while offering full‑range coverage.
Key specification highlights:
• Bandwidth: DC to 1 GHz
• Voltage measurement: ± 0.01 V to ±20 kV
• Maximum common-mode voltage: 85kV
• Parasitic input capacitance: ≤1pF (Ultra-low load effect)
• Common-mode rejection ratio (CMRR): up to 180dB
• Measurement accuracy: half Within the bandwidth ≤ ±1%
• Temperature Coefficient: Zero temperature drift (ADHOMT Technology)
• Calibration: No manual calibration required , Ready to use right out of the box
• Interface: Standard BNC , compatible with oscilloscopes of all brands
• Attenuator: universally interchangeable, shock-resistant, long-lasting
All‑round customization for multiple scenarios, meeting even the most demanding operating conditions in a single solution.
Targeting Extreme high and low temperatures, radio-frequency high voltage, ultra-high voltage, and weak signals For demanding, specialized test scenarios, Microsemi’s third-generation optical isolation probes offer highly customizable solutions, effortlessly addressing a wide range of non‑standard application requirements.
Customization supported:
• Customizable Extended attenuator , perfectly compatible with high- and low-temperature chamber test environments
• Customizable Probe fiber length , meeting the requirements for long-distance isolation testing
• Customizable 110 kV The above ultra-high voltage Quarantine Test
• Customizable 5000V The above Radiofrequency high voltage Test
• Customizable 20kV Ultra-high voltage and full-range voltage testing up to 20 kV
Zero temperature drift + no calibration required, breaking through industry bottlenecks.
Based on Micsig Exclusive ADHOMT Analog-Digital Hybrid Laser Modulation Technology , real-time monitoring of core parameters and dynamic laser modulation, truly achieving Zero temperature drift, no manual calibration required 。
• Ready to use right out of the box—no warm-up required.
• Support 365 days × 24 hours Continuous and Precise Testing
• Completely resolves the common pain points of temperature drift in standard optical isolation probes and the need for frequent calibration.
• Overcoming the bottlenecks of efficient, reliable, and continuous testing in power semiconductor packaging and testing lines
The attenuator features a completely redesigned structure, offering universal compatibility, durability, cost reduction, and enhanced efficiency.
A completely redesigned attenuator structure, Significantly enhanced resistance to wear and impact. , It is resistant to damage under prolonged high‑load testing, thereby reducing operational and maintenance costs.
The same model attenuator can Universal compatibility, not tied to a specific host , resulting in higher equipment utilization and seamless adaptation to multi-station rapid switching, thereby significantly boosting testing efficiency.
Excellent amplitude-frequency characteristics ensure faithful reproduction of full‑band signals.
An excellent amplitude–frequency response is the key to ensuring test accuracy. The third-generation optically isolated probe from Mcosense. Achieving 1% measurement accuracy within a ½‑bandwidth range , breaking with tradition One fifth Bandwidth testing rule (traditionally, it is believed that when the frequency of the signal under test exceeds the bandwidth of the test instrument) One fifth Subsequent test accuracy is for reference only; it accurately captures full‑band signals, suppresses distortion, and perfectly reproduces the true waveform.
It can fully meet the high‑precision, high‑bandwidth testing requirements of third‑generation semiconductors (SiC/GaN) and new‑energy electric control systems, providing reliable data support.
Comprehensive thermal upgrades ensure long-term stable operation.
Optimize the thermal management structure and fan design, Dual improvement in cooling efficiency It is compatible with long‑duration, high‑load continuous testing, preventing overheating and interruptions to ensure test continuity and further reduce operational and maintenance costs.
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Email: sales@micsig.com
Company: Shenzhen Micsig Technology Co., Ltd.
Address: 6F, Jinhuanyu Building, No. 56, Tiezai Road, Bao'an District, Shenzhen, Guangdong, China.
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