Home

Micsig Third-Generation Optical-fiber Isolated Probe MOIP Series Wins “Outstanding Technology Innovation Product” Award

Release time:2026-07-06

Recently, the 2026 Conference on Power Semiconductor Devices and Integrated Circuits (CSPSD 2026) was held in Lingang, Shanghai. At the outstanding power semiconductor product selection event held alongside the conference, Micsig’s self-developed third-generation SigOFIT Optical-fiber Isolated Probe MOIP Series was honored as an “Outstanding Technology Innovation Product” for its leading technological innovation and proven industrial application achievements.

The CSPSD conference series, guided by the China Advanced Semiconductor Industry Innovation Alliance (CASA), is a highly influential professional industry exchange platform in China’s power semiconductor and integrated circuit sector. This year’s conference focused on technology iteration and system innovation driven by the wave of power semiconductor industrialization, bringing together leading scholars, technology pioneers, and industry trailblazers. The outstanding power semiconductor product selection event was open to power semiconductor enterprises nationwide, with submissions evaluated by the conference organizing committee across two key dimensions: technological innovation and market performance.

The third-generation SigOFIT Optical-fiber Isolated Probe MOIP Series is Micsig’s flagship product designed to address the testing challenges of third-generation semiconductors. Built on the proprietary SigOFIT™ optical isolation technology, the series delivers bandwidth from 200 MHz to 1 GHz, maintaining a CMRR as high as 108 dB at the 1 GHz frequency band, an isolation voltage of up to 85 kVpk, a noise floor below 0.3 mVrms, and DC gain accuracy better than 1%. The probe employs advanced laser power supply technology—requiring no batteries and supporting 24/7 uninterrupted precision testing. With an input capacitance as low as 1 pF, it enables safe measurement of GaN and other third-generation semiconductor devices.

Since its market launch, the MOIP Series has been widely adopted across SiC/GaN power device double-pulse testing, new energy vehicle electric drive systems, photovoltaic inverters, and industrial power supply R&D. It helps engineers faithfully reproduce switching waveforms in high-voltage floating-ground and strong-electromagnetic-interference environments, effectively resolving the industry pain points of severe common-mode noise interference and distorted measurement results in third-generation semiconductor testing.

This award represents the industry’s strong endorsement of Micsig’s technological innovation capabilities and industrialization achievements in the optical-fiber isolated probe domain. Micsig will continue to deepen its focus on the test and measurement field, empowering the high-quality development of the third-generation semiconductor and power electronics industry with ultra-precise measurement technology.